Handheld Thermo Scientific NITON XRF analyzers automatically compensate for many
effects that would otherwise bias or distort sample analyses. These effects
include:
● Geometric effects caused by the sample's shape, surface texture, thickness and
density
● Spectral interferences
● Sample matrix effects including critical absorption of the characteristic
x-rays of one element by other elements in the sample, and secondary and
tertiary x-ray excitation of one or more elements by other elements in the
sample.
By automatically adjusting for these effects, NITON XRF analyzers are able to
determine the chemistries of samples of widely different sample compositions,
typically in seconds, without any requirement for instrument users to input
empirical, sample specific calibrations. In typical samples containing many
elements, the elements may range in concentrations from high percent levels down
to parts per million (ppm).
In sample matrices such as typical mining samples, metal and precious metal
alloys, it is necessary to measure both lighter elements that emit lower energy
x-rays (that are easily absorbed) as well as heavier elements that emit much
higher energy x-rays (that penetrate comparatively long distances through the
sample).
NITON Analyzers and X-ray
Fluorescence

Compensation must be made for a variety of geometric effects. In these
multi-element samples, it is also possible that one or more elements present act
as critical absorbers. The effects of absorption, enhancement, and secondary
fluorescence vary widely depending on the chemistry of the sample matrix, but in
a sample with many elements in substantial concentrations, multiple absorptions,
secondary and also tertiary x-ray fluorescence effects are typically present.
NITON XRF analyzers compensate for all of these effects in order to determine
the actual concentration of elements in multi-element samples from the modified
fluorescence x-ray spectrum that these samples produce in the XRF analyzer. To
do this, we employ multiple methods to determine the true composition of these
complex samples from their x-ray spectra. These include:
● Fundamental Parameters (FP) analysis
● Compton Normalization (CN)
● Spectral matching (“fingerprint”) empirical calibrations
● User-definable empirical calibrations
● Various combinations of these techniques.
Because of FP analysis and other advanced technology, in a variety of
testing applications, NITON users require little if any specialized
knowledge or laboratory training to work effectively in the field. In
industries like mining and mineral exploration this means non-technical
personnel can perform the work. In metal and precious metal analysis,
the Thermo Scientific NITON XRF analyzer's standard FP algorithms are
used in combination with a built in grade-identification library that
enable the user to identify hundreds of metal and/or precious metal
alloy grades in seconds. Costs are lower and users more productive with
immediate on-site analysis – no more waiting for lab results
From the inside out, these revolutionary instruments were designed to
make our customers more successful. Capitalizing on the explosive growth
of consumer electronics, they incorporate 80 MHz real-time digital
signal processing, and dual state-of-the-art embedded processors for
computation, data storage, communication and other functions. The very
best in technology has been engineered into the Thermo Scientific NITON
XL3t and XL3p to provide users with high-performance today, scalability
for tomorrow, and a robust foundation to develop future features and
applications.